The Hitachi S4000 Field Emission Scanning Electron Microscope (FESEM) with IXRF Energy-dispersive X-ray Spectrometer (EDS) is a cold field emission SEM that is fast and easy to use. Good for ...
This instrument is an ultra-high-resolution scanning electron microscope capable of secondary-electron image resolution of 1.2 nm. It is fully digital and incorporates an image archiving computer.
The FEI Philips XL 40 Environmental Scanning Microscope (ESEM) is a large-chamber, tungsten source, environmental scanning electron microscope capable of high and low vacuum imaging. The FEI Philips ...
This instrument is an advanced and digitally dedicated transmission electron microscope operating at 200kV with a field-emission gun. It is capable of an ultimate point-to-point resolution of 0.19 nm, ...
ECUBLENS, Switzerland (April 28, 2005) - Thermo Electron Corporation's (NYSE: TMO) new ARL QUANT'X Energy Dispersive X-ray Fluorescence (EDXRF) system helps manufacturers, sellers, distributors and ...
McPherson’s 248/130 grazing incidence wavelength dispersive optical spectrometer allows rapid analysis of spectral light in the ~1 to 300nm wavelength region (4 to ~1200eV.) A useful tool for ...
The Hitachi SU70 Field Emission Scanning Electron Microscope (FESEM) with Oxford Energy-dispersive X-ray Spectrometer (EDS) is a top level research grade SEM with excellent performance both at low kV ...
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