(Nanowerk News) Turning up the intensity of x-ray beams used to probe the atomic structures of materials can actually reduce the intensity of x-rays scattered from the material, a RIKEN-led team has ...

The SACLA free-electron laser facility, where the experiment on the diffraction of ultra-short X-ray pulses on crystalline silicon samples was carried out. When we illuminate something, we usually ...

With the development of different techniques for the synthesis of nanomaterials, researchers are constantly looking for a more precise instrument for their nanoscale characterization. X-ray ...

In this session the details of XRD experiment design will be discussed with topics such as; understanding what will be determined from the sample, sample preparation, sample mounting, and details of ...

Light fields, as a form of electromagnetic waves, are characterized by fundamental parameters including intensity, phase, and polarization. Precise imaging of these three parameters is crucial for ...

X-ray crystallography, like mass spectroscopy and nuclear spectroscopy, is an extremely useful material characterization technique that is unfortunately hard for amateurs to perform. The physical ...

Particle size analysis is crucial to quality control and product development in a number of key industries including aerosols, construction, food and beverage, paint and coatings, and pharmaceuticals.

The SACLA free-electron laser facility, where the experiment on the diffraction of ultra-short X-ray pulses on crystalline silicon samples was carried out. Credit: SACLA The SACLA free-electron laser ...