This article examines the use of femtosecond (fs) laser ablation for site-specific TEM sample preparation in a FIB-SEM. Various workflows are shown facilitating TEM lamella preparation of regions of ...
Sample preparation involves gaining access to a feature of a sample for subsequent analysis. Doing so allows engineers and scientists to find a solution for damaged parts or better understand ...
CHEMNITZ, Germany, July 9, 2018 /PRNewswire/ -- 3D-Micromac AG, the industry leader in laser micromachining and roll-to-roll laser systems for the semiconductor, photovoltaic, medical device and ...
Carl Zeiss has launched the AURIGA® Laser, a new advanced system combining the specific advantages of the AURIGA® CrossBeam (FIB-SEM) workstation with the capabilities of a pulsed micro-focus laser ...
In 2026, the semiconductor industry is entering a stage where quality assurance and failure analysis (FA) must operate with ...
Raman spectroscopy can be used to measure the chemical composition of a sample, which can in turn be used to extract biological information. Many materials have characteristic Raman spectra, which ...
A common theme of many of the presentations at the Knowledge Foundation’s “Sample Prep” conference, to be held this month in Baltimore, will be how to purify nucleic acids, including DNA, RNA, and ...
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