Relying solely on end-of-line testing isn't enough when security, traceability, and mission reliability are vital.

Plastic deformation in metals and alloys is governed by the generation and evolution of defects of point, line, plane and volume types 1,2. Among these defects, stacking fault tetrahedra (SFT), ...

Full-blown process excursions that affect every wafer are comparatively easy for fabs to detect and fix. However, “onesie-twosie,” lower-volume excursions can go unresolved for months or even years.

(Nanowerk News) SEMATECH announced today that researchers have reached a significant milestone in reducing tool-generated defects from multi-layer deposition of mask blanks used for extreme ...

Positron Annihilation Spectroscopy (PAS) is a highly sensitive, non-destructive method for probing atomic-scale imperfections in a broad spectrum of materials, from metals and ceramics to polymers and ...

Lead halide perovskites can be turned into optoelectronic devices through low-cost solution depositions, but these approaches often leave numerous charge-trapping defects in the perovskite.