The Carl Zeiss AURIGA CrossBeam Focused Ion Beam Electron Microscope is a state-of-the-art advanced scanning electron microscope integrated with high-resolution focused ion beam milling that enables ...

Universal software designed to operate any ZEISS light or electron microscope Easy navigation, streamlined SEM operation, and integrated EDS analysis Solution for connected microscopy WHITE PLAINS, ...

Zeiss Microscopy, Jena, Germany, a manufacturer of visible, electron, X-ray and ion microscope systems, has added two super-resolution microscopes to its structured illumination microscopy (SIM) range ...

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McMaster University enables new innovative capability in multi-length scale experiments for materials across diverse research fields through a new partnership between the Canadian Centre for Electron ...

More than 70 users of ZEISS electron and ion microscopes have already submitted their nano masterpieces to the first ever Carl Zeiss Nano Image Contest. Agar Scientific chose the RMS' biannual ...

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Today, ZEISS is introducing its new integrated in situ workflow for ZEISS field emission scanning electron microscopes (FE-SEM). When researchers need to link material performance to microstructure, ...

LONDON--(BUSINESS WIRE)--The global automated microscopy market is poised to grow by USD 917.33 million during 2020-2024, progressing at a CAGR of almost 9% during the forecast period. Request Free ...