Quantum Focus Instruments Corporation (QFI) designs and manufactures advanced failure analysis microscope systems and temperature measurement microscope systems for the …

The primary microscopy solutions used today in failure analysis are photoemission (emmi TM), MWIR hot spot detection (Thermal-HS), and laser signal injection microscopy (XIVA TM …

InfraScope TM Temperature Measurement Microscope Systems: Founded in 1997 as a spin off of EDO/Barnes Engineering, a world-renowned pioneer in the field of IR detectors, QFI’s …

Quantum Focus Instruments Corporation was founded in 1997 as a spin-off from EDO/Barnes Engineering. EDO/Barnes was a well-known pioneer in IR detectors and systems (first infrared …

XIVA TM LSIM (Laser Signal Injection Microscopy): XIVA TM LSIM (Laser Signal Injection Microscopy) is used to locate shorts, junction defects, problem VIAs and other integrated …

Thermal-HS Infrared Hot Spot Detection Microscopy: A traditional approach to finding shorts in semiconductor devices has been liquid crystal investigation. Unfortunately, liquid crystal …

InfraScope TM MWIR Temperature Mapping Microscope: InfraScope TM Temperature Mapping Microscope addresses an important aspect of managing device reliability. True temperature …

It should be noted that high Quantum Efficiency (QE) is an important characteristic of a quality emmi TM sensor. However, without consideration of signal-to-noise performance, QE can be …

QuantumScope TM Failure Analysis Microscope Systems: QuantumScope TM microscopes are designed to accept multiple sensors, covering a broad range of analytical techniques for failure …

T°Imager™ is normally an optional technique on the InfraScope™ system, but is also available in a standalone microscope format. T°Imager™ consists of a microscope optical head, control …